BibTeX record conf/ism2/TheodosiouRPTPD23

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@inproceedings{DBLP:conf/ism2/TheodosiouRPTPD23,
  author       = {Theodosis Theodosiou and
                  Aikaterini Rapti and
                  Konstantinos Papageorgiou and
                  Theodoros Tziolas and
                  Elpiniki Papageorgiou and
                  Nikolaos Dimitriou and
                  George Margetis and
                  Dimitrios Tzovaras},
  editor       = {Francesco Longo and
                  Michael Affenzeller and
                  Antonio Padovano and
                  Weiming Shen},
  title        = {A Review Study on ML-based Methods for Defect-Pattern Recognition
                  in Wafer Maps},
  booktitle    = {Proceedings of the 4th International Conference on Industry 4.0 and
                  Smart Manufacturing {(ISM} 2023), Lisbon, Portugal, 22-24 November
                  2023},
  series       = {Procedia Computer Science},
  volume       = {217},
  pages        = {570--583},
  publisher    = {Elsevier},
  year         = {2023},
  url          = {https://doi.org/10.1016/j.procs.2022.12.253},
  doi          = {10.1016/J.PROCS.2022.12.253},
  timestamp    = {Mon, 05 Feb 2024 20:33:11 +0100},
  biburl       = {https://dblp.org/rec/conf/ism2/TheodosiouRPTPD23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}