BibTeX record conf/irps/WuMJHBSGDR15

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@inproceedings{DBLP:conf/irps/WuMJHBSGDR15,
  author       = {Tian{-}Li Wu and
                  Denis Marcon and
                  Brice De Jaeger and
                  Marleen Van Hove and
                  Benoit Bakeroot and
                  Steve Stoffels and
                  Guido Groeseneken and
                  Stefaan Decoutere and
                  Robin Roelofs},
  title        = {Time dependent dielectric breakdown {(TDDB)} evaluation of {PE-ALD}
                  SiN gate dielectrics on AlGaN/GaN recessed gate D-mode MIS-HEMTs and
                  E-mode MIS-FETs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {6},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112769},
  doi          = {10.1109/IRPS.2015.7112769},
  timestamp    = {Tue, 07 May 2024 20:11:33 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/WuMJHBSGDR15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}