BibTeX record conf/irps/WangWCLKZYCS20

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@inproceedings{DBLP:conf/irps/WangWCLKZYCS20,
  author       = {Yang Wang and
                  Chen Wang and
                  Tao Chen and
                  Hao Liu and
                  Chinte Kuo and
                  Ke Zhou and
                  Binfeng Yin and
                  Lin Chen and
                  Qing{-}Qing Sun},
  title        = {Front-plane and Back-plane Bias Temperature Instability of 22 nm Gate-last
                  {FDSOI} MOSFETs},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9129093},
  doi          = {10.1109/IRPS45951.2020.9129093},
  timestamp    = {Mon, 25 Jul 2022 12:23:57 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/WangWCLKZYCS20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}