BibTeX record conf/irps/VollertsenGKO15

download as .bib file

@inproceedings{DBLP:conf/irps/VollertsenGKO15,
  author       = {Rolf{-}Peter Vollertsen and
                  Georg Georgakos and
                  K. K{\"{o}}lpin and
                  C. Olk},
  title        = {A fWLR test structure and method for device reliability monitoring
                  using product relevant circuits},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {3},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112781},
  doi          = {10.1109/IRPS.2015.7112781},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/VollertsenGKO15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.