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"A fWLR test structure and method for device reliability monitoring using ..."

Rolf-Peter Vollertsen et al. (2015)

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DOI: 10.1109/IRPS.2015.7112781

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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  - conf/irps/VollertsenGKO15
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Rolf-Peter Vollertsen, Georg Georgakos, K. Kölpin, C. Olk:
A fWLR test structure and method for device reliability monitoring using product relevant circuits. IRPS 2015: 3

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