BibTeX record conf/irps/VandemaeleKBFCMMHG23

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@inproceedings{DBLP:conf/irps/VandemaeleKBFCMMHG23,
  author       = {Michiel Vandemaele and
                  Ben Kaczer and
                  Erik Bury and
                  Jacopo Franco and
                  Adrian Chasin and
                  Alexander Makarov and
                  Hans Mertens and
                  Geert Hellings and
                  Guido Groeseneken},
  title        = {Investigating Nanowire, Nanosheet and Forksheet {FET} Hot-Carrier
                  Reliability via {TCAD} Simulations: Invited Paper},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
                  CA, USA, March 26-30, 2023},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IRPS48203.2023.10118211},
  doi          = {10.1109/IRPS48203.2023.10118211},
  timestamp    = {Sat, 30 Sep 2023 09:49:39 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/VandemaeleKBFCMMHG23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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