BibTeX record conf/irps/SonKKLKP21

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@inproceedings{DBLP:conf/irps/SonKKLKP21,
  author       = {Donghee Son and
                  Gang{-}Jun Kim and
                  Jongkyun Kim and
                  Nam{-}Hyun Lee and
                  Kijin Kim and
                  Sangwoo Pae},
  title        = {Effect of High Temperature on Recovery of Hot Carrier Degradation
                  of scaled nMOSFETs in {DRAM}},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
                  CA, USA, March 21-25, 2021},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/IRPS46558.2021.9405153},
  doi          = {10.1109/IRPS46558.2021.9405153},
  timestamp    = {Fri, 21 May 2021 07:22:46 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/SonKKLKP21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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