"Effect of High Temperature on Recovery of Hot Carrier Degradation of ..."

Donghee Son et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405153

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-21

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Donghee Son, Gang-Jun Kim, Jongkyun Kim, Nam-Hyun Lee, Kijin Kim, Sangwoo Pae:
Effect of High Temperature on Recovery of Hot Carrier Degradation of scaled nMOSFETs in DRAM. IRPS 2021: 1-4

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