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"Effect of High Temperature on Recovery of Hot Carrier Degradation of ..."
Donghee Son et al. (2021)
- Donghee Son, Gang-Jun Kim, Jongkyun Kim, Nam-Hyun Lee, Kijin Kim, Sangwoo Pae:
Effect of High Temperature on Recovery of Hot Carrier Degradation of scaled nMOSFETs in DRAM. IRPS 2021: 1-4
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