BibTeX record conf/irps/ShirotaYCWWCYAT15

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@inproceedings{DBLP:conf/irps/ShirotaYCWWCYAT15,
  author       = {Riichiro Shirota and
                  Bo{-}Jun Yang and
                  Yung{-}Yueh Chiu and
                  Yu{-}Ting Wu and
                  Pin{-}Yao Wang and
                  Jung{-}Ho Chang and
                  Masaru Yano and
                  Minoru Aoki and
                  Toshiaki Takeshita and
                  C.{-}Y. Wang and
                  Ikuo Kurachi},
  title        = {Improvement of oxide reliability in {NAND} flash memories using tight
                  endurance cycling with shorter idling period},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {12},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112814},
  doi          = {10.1109/IRPS.2015.7112814},
  timestamp    = {Fri, 05 Aug 2022 09:29:53 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/ShirotaYCWWCYAT15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}