BibTeX record conf/irps/ShiozakiS22

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@inproceedings{DBLP:conf/irps/ShiozakiS22,
  author       = {Masato Shiozaki and
                  Takashi Sato},
  title        = {Characteristic Degradation of Power MOSFETs by X-Ray Irradiation and
                  Their Recovery},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {64--1},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764536},
  doi          = {10.1109/IRPS48227.2022.9764536},
  timestamp    = {Tue, 07 May 2024 20:11:34 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/ShiozakiS22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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