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"Characteristic Degradation of Power MOSFETs by X-Ray Irradiation and Their ..."

Masato Shiozaki, Takashi Sato (2022)

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DOI: 10.1109/IRPS48227.2022.9764536

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-09

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  - conf/irps/ShiozakiS22
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Masato Shiozaki, Takashi Sato:
Characteristic Degradation of Power MOSFETs by X-Ray Irradiation and Their Recovery. IRPS 2022: 64-1

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