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BibTeX record conf/irps/RenLWZYLSWZGWXH18
@inproceedings{DBLP:conf/irps/RenLWZYLSWZGWXH18, author = {Pengpeng Ren and Changze Liu and Sanping Wan and Jiayang Zhang and Zhuoqing Yu and Nie Liu and Yongsheng Sun and Runsheng Wang and Canhui Zhan and Zhenghao Gan and Waisum Wong and Yu Xia and Ru Huang}, title = {New insights into the {HCI} degradation of pass-gate transistor in advanced FinFET technology}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame, CA, USA, March 11-15, 2018}, pages = {3--1}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/IRPS.2018.8353656}, doi = {10.1109/IRPS.2018.8353656}, timestamp = {Mon, 03 Jun 2024 16:30:04 +0200}, biburl = {https://dblp.org/rec/conf/irps/RenLWZYLSWZGWXH18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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