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"New insights into the HCI degradation of pass-gate transistor in advanced ..."

Pengpeng Ren et al. (2018)

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DOI: 10.1109/IRPS.2018.8353656

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-22

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  - conf/irps/RenLWZYLSWZGWXH18
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  - https://dblp.org/rec/conf/irps/RenLWZYLSWZGWXH18
Pengpeng Ren, Changze Liu, Sanping Wan, Jiayang Zhang, Zhuoqing Yu, Nie Liu, Yongsheng Sun, Runsheng Wang, Canhui Zhan, Zhenghao Gan, Waisum Wong, Yu Xia, Ru Huang:
New insights into the HCI degradation of pass-gate transistor in advanced FinFET technology. IRPS 2018: 3-1

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