BibTeX record conf/irps/PirroLBKHZJEGOZ22

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@inproceedings{DBLP:conf/irps/PirroLBKHZJEGOZ22,
  author       = {Luca Pirro and
                  P. Liebscher and
                  C. Brantz and
                  M. Kessler and
                  H. Herzog and
                  Olaf Zimmerhackl and
                  R. Jain and
                  E. Ebrand and
                  K. Gebauer and
                  Michael Otto and
                  Alban Zaka and
                  Jan Hoentschel},
  title        = {Impact of Electrical Defects located at Transistor Periphery on Analog
                  and {RTN} Device Performance},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {59--1},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764532},
  doi          = {10.1109/IRPS48227.2022.9764532},
  timestamp    = {Mon, 07 Aug 2023 15:56:18 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/PirroLBKHZJEGOZ22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}