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"Impact of Electrical Defects located at Transistor Periphery on Analog and ..."

Luca Pirro et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764532

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-07

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  dblp key:
  - conf/irps/PirroLBKHZJEGOZ22
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  - https://dblp.org/rec/conf/irps/PirroLBKHZJEGOZ22
Luca Pirro, P. Liebscher, C. Brantz, M. Kessler, H. Herzog, Olaf Zimmerhackl, R. Jain, E. Ebrand, K. Gebauer, Michael Otto, Alban Zaka, Jan Hoentschel:
Impact of Electrical Defects located at Transistor Periphery on Analog and RTN Device Performance. IRPS 2022: 59-1

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