BibTeX record conf/irps/NairBTZCGKC20

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@inproceedings{DBLP:conf/irps/NairBTZCGKC20,
  author       = {Sarath Mohanachandran Nair and
                  Rajendra Bishnoi and
                  Mehdi B. Tahoori and
                  Houman Zahedmanesh and
                  Kristof Croes and
                  Kevin Garello and
                  Gouri Sankar Kar and
                  Francky Catthoor},
  title        = {Physics based modeling of bimodal electromigration failure distributions
                  and variation analysis for {VLSI} interconnects},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9128313},
  doi          = {10.1109/IRPS45951.2020.9128313},
  timestamp    = {Thu, 14 Oct 2021 10:37:07 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/NairBTZCGKC20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}