BibTeX record conf/irps/LichtenwalnerHB18

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@inproceedings{DBLP:conf/irps/LichtenwalnerHB18,
  author       = {Daniel J. Lichtenwalner and
                  Brett Hull and
                  Edward Van Brunt and
                  Shadi Sabri and
                  Donald A. Gajewski and
                  Dave Grider and
                  Scott Allen and
                  John W. Palmour and
                  Akin Akturk and
                  James McGarrity},
  title        = {Reliability studies of SiC vertical power MOSFETs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {2},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353544},
  doi          = {10.1109/IRPS.2018.8353544},
  timestamp    = {Thu, 14 Oct 2021 10:37:08 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/LichtenwalnerHB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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