"Reliability studies of SiC vertical power MOSFETs."

Daniel J. Lichtenwalner et al. (2018)

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DOI: 10.1109/IRPS.2018.8353544

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Daniel J. Lichtenwalner, Brett Hull, Edward Van Brunt, Shadi Sabri, Donald A. Gajewski, Dave Grider, Scott Allen, John W. Palmour, Akin Akturk, James McGarrity:
Reliability studies of SiC vertical power MOSFETs. IRPS 2018: 2

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