BibTeX record conf/irps/LeurquinVVGESDI22

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@inproceedings{DBLP:conf/irps/LeurquinVVGESDI22,
  author       = {Camille Leurquin and
                  William Vandendaele and
                  Aby{-}Ga{\"{e}}l Viey and
                  Romain Gwoziecki and
                  Ren{\'{e}} Escoffier and
                  R. Salot and
                  Ghislain Despesse and
                  Ferdinando Iucolano and
                  Roberto Modica and
                  Aurore Constant},
  title        = {Novel High Voltage Bias Temperature Instabilities {(HV-BTI)} setup
                  to monitor {RON/VTH} drift on GaN-on-Si E-mode MOSc-HEMTs under drain
                  voltage},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {10},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764482},
  doi          = {10.1109/IRPS48227.2022.9764482},
  timestamp    = {Mon, 08 Jul 2024 08:23:15 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/LeurquinVVGESDI22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}