BibTeX record conf/irps/KumarUSKPHH23

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@inproceedings{DBLP:conf/irps/KumarUSKPHH23,
  author       = {Akhil S. Kumar and
                  Michael J. Uren and
                  Matthew D. Smith and
                  Martin Kuball and
                  Justin Parke and
                  H. George Henry and
                  Robert S. Howell},
  title        = {Dielectric Thickness and Fin Width Dependent OFF-State Degradation
                  in AlGaN/GaN SLCFETs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
                  CA, USA, March 26-30, 2023},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IRPS48203.2023.10118346},
  doi          = {10.1109/IRPS48203.2023.10118346},
  timestamp    = {Tue, 07 May 2024 20:11:33 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/KumarUSKPHH23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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