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"Dielectric Thickness and Fin Width Dependent OFF-State Degradation in ..."
Akhil S. Kumar et al. (2023)
- Akhil S. Kumar, Michael J. Uren
, Matthew D. Smith, Martin Kuball, Justin Parke, H. George Henry, Robert S. Howell:
Dielectric Thickness and Fin Width Dependent OFF-State Degradation in AlGaN/GaN SLCFETs. IRPS 2023: 1-4
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