BibTeX record conf/irps/KemmerDBPBKQA20

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@inproceedings{DBLP:conf/irps/KemmerDBPBKQA20,
  author       = {Tobias Kemmer and
                  Michael Dammann and
                  Martina Baeumler and
                  Vladimir Polyakov and
                  Peter Br{\"{u}}ckner and
                  Helmer Konstanzer and
                  R{\"{u}}diger Quay and
                  Oliver Ambacher},
  title        = {Failure Analysis of 100 nm AlGaN/GaN HEMTs Stressed under On- and
                  Off-State Stress},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9128308},
  doi          = {10.1109/IRPS45951.2020.9128308},
  timestamp    = {Thu, 14 Oct 2021 10:37:10 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/KemmerDBPBKQA20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}