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"Failure Analysis of 100 nm AlGaN/GaN HEMTs Stressed under On- and ..."
Tobias Kemmer et al. (2020)
- Tobias Kemmer
, Michael Dammann, Martina Baeumler, Vladimir Polyakov, Peter Brückner, Helmer Konstanzer, Rüdiger Quay
, Oliver Ambacher:
Failure Analysis of 100 nm AlGaN/GaN HEMTs Stressed under On- and Off-State Stress. IRPS 2020: 1-6
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