BibTeX record conf/irps/IgarashiUTTSN18

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@inproceedings{DBLP:conf/irps/IgarashiUTTSN18,
  author       = {Mitsuhiko Igarashi and
                  Yuuki Uchida and
                  Yoshio Takazawa and
                  Yasumasa Tsukamoto and
                  Koji Shibutani and
                  Koji Nii},
  title        = {Study of impact of BTI's local layout effect including recovery effect
                  on various standard-cells in 10nm FinFET},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {1},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353654},
  doi          = {10.1109/IRPS.2018.8353654},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/IgarashiUTTSN18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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