"Study of impact of BTI's local layout effect including recovery effect on ..."

Mitsuhiko Igarashi et al. (2018)

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DOI: 10.1109/IRPS.2018.8353654

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-22

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  - conf/irps/IgarashiUTTSN18
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  - https://dblp.org/rec/conf/irps/IgarashiUTTSN18
Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii:
Study of impact of BTI's local layout effect including recovery effect on various standard-cells in 10nm FinFET. IRPS 2018: 1

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