BibTeX record conf/irps/HungCCCLH21

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@inproceedings{DBLP:conf/irps/HungCCCLH21,
  author       = {Shih{-}che Hung and
                  Shih{-}Chang Chen and
                  Pei{-}Shan Chien and
                  Yu{-}Sheng Cho and
                  Yung{-}Huei Lee and
                  Wei{-}Shuo Hung},
  title        = {Time-Efficient Characterization of Time-Dependent Gate Oxide Breakdwon
                  Using Tunable Ramp Voltage Stress {(TRVS)} Method for Automotive Applications},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
                  CA, USA, March 21-25, 2021},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/IRPS46558.2021.9405144},
  doi          = {10.1109/IRPS46558.2021.9405144},
  timestamp    = {Thu, 20 May 2021 08:27:18 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/HungCCCLH21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}