BibTeX record conf/irps/GraffSPA18

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@inproceedings{DBLP:conf/irps/GraffSPA18,
  author       = {Andreas Graff and
                  Mich{\'{e}}l Simon{-}Najasek and
                  David Poppitz and
                  Frank Altmann},
  title        = {Physical failure analysis methods for wide band gap semiconductor
                  devices},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {3},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353557},
  doi          = {10.1109/IRPS.2018.8353557},
  timestamp    = {Tue, 07 May 2024 20:11:34 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/GraffSPA18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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