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"Physical failure analysis methods for wide band gap semiconductor devices."

Andreas Graff et al. (2018)

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DOI: 10.1109/IRPS.2018.8353557

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Andreas Graff, Michél Simon-Najasek, David Poppitz, Frank Altmann:
Physical failure analysis methods for wide band gap semiconductor devices. IRPS 2018: 3

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