BibTeX record conf/irps/FiorenzaBMSGR22

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@inproceedings{DBLP:conf/irps/FiorenzaBMSGR22,
  author       = {Patrick Fiorenza and
                  Corrado Bongiorno and
                  Angelo Alberto Messina and
                  Mario Saggio and
                  Filippo Giannazzo and
                  Fabrizio Roccaforte},
  title        = {SiO2/4H-SiC interfacial chemistry as origin of the threshold voltage
                  instability in power MOSFETs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {3},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764490},
  doi          = {10.1109/IRPS48227.2022.9764490},
  timestamp    = {Sat, 28 Oct 2023 13:59:39 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/FiorenzaBMSGR22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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