BibTeX record conf/irps/FeilRKAGG22

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@inproceedings{DBLP:conf/irps/FeilRKAGG22,
  author       = {Maximilian W. Feil and
                  Hans Reisinger and
                  Andr{\'{e}} Kabakow and
                  Thomas Aichinger and
                  Wolfgang Gustin and
                  Tibor Grasser},
  title        = {Optical Emission Correlated to Bias Temperature Instability in SiC
                  MOSFETs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {3},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764584},
  doi          = {10.1109/IRPS48227.2022.9764584},
  timestamp    = {Sun, 02 Oct 2022 16:09:05 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/FeilRKAGG22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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