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"Optical Emission Correlated to Bias Temperature Instability in SiC MOSFETs."

Maximilian W. Feil et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764584

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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  dblp key:
  - conf/irps/FeilRKAGG22
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  - https://dblp.org/rec/conf/irps/FeilRKAGG22
Maximilian W. Feil, Hans Reisinger, André Kabakow, Thomas Aichinger, Wolfgang Gustin, Tibor Grasser:
Optical Emission Correlated to Bias Temperature Instability in SiC MOSFETs. IRPS 2022: 3

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