BibTeX record conf/irps/ChungKH18

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@inproceedings{DBLP:conf/irps/ChungKH18,
  author       = {C. Chung and
                  D. Kobayashi and
                  K. Hirose},
  title        = {Threshold ion parameters of line-type soft-errors in biased thin-BOX
                  {SOI} SRAMs: Difference between sensitivities to terrestrial and space
                  radiation},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {4},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353585},
  doi          = {10.1109/IRPS.2018.8353585},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/ChungKH18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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