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"Threshold ion parameters of line-type soft-errors in biased thin-BOX SOI ..."

C. Chung, D. Kobayashi, K. Hirose (2018)

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DOI: 10.1109/IRPS.2018.8353585

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-22

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  dblp key:
  - conf/irps/ChungKH18
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C. Chung, D. Kobayashi, K. Hirose:
Threshold ion parameters of line-type soft-errors in biased thin-BOX SOI SRAMs: Difference between sensitivities to terrestrial and space radiation. IRPS 2018: 4

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