BibTeX record conf/irps/CastellazziFZOP18

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@inproceedings{DBLP:conf/irps/CastellazziFZOP18,
  author       = {Alberto Castellazzi and
                  Asad Fayyaz and
                  Siwei Zhu and
                  Thorsten Oeder and
                  Martin Pfost},
  title        = {Single pulse short-circuit robustness and repetitive stress aging
                  of GaN GITs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {4},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353593},
  doi          = {10.1109/IRPS.2018.8353593},
  timestamp    = {Mon, 15 Jun 2020 17:10:58 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/CastellazziFZOP18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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