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"Single pulse short-circuit robustness and repetitive stress aging of GaN GITs."
Alberto Castellazzi et al. (2018)
- Alberto Castellazzi
, Asad Fayyaz
, Siwei Zhu, Thorsten Oeder, Martin Pfost:
Single pulse short-circuit robustness and repetitive stress aging of GaN GITs. IRPS 2018: 4
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