BibTeX record conf/irps/BastosOFTTCDKRC22

• > Home > conf/irps/BastosOFTTCDKRC22

@inproceedings{DBLP:conf/irps/BastosOFTTCDKRC22,
  author       = {J. P. Bastos and
                  Barry J. O'Sullivan and
                  Jacopo Franco and
                  Stanislav Tyaginov and
                  Brecht Truijen and
                  Adrian Vaisman Chasin and
                  Robin Degraeve and
                  Ben Kaczer and
                  Romain Ritzenthaler and
                  Elena Capogreco and
                  E. Dentoni Litta and
                  Alessio Spessot and
                  Yusuke Higashi and
                  Y. Yoon and
                  V. Machkaoutsan and
                  Pierre Fazan and
                  N. Horiguchi},
  title        = {Bias Temperature Instability {(BTI)} of High-Voltage Devices for Memory
                  Periphery},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764547},
  doi          = {10.1109/IRPS48227.2022.9764547},
  timestamp    = {Fri, 16 Jun 2023 10:01:56 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/BastosOFTTCDKRC22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}