BibTeX record conf/iolts/AmrouchSPKSTH19

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@inproceedings{DBLP:conf/iolts/AmrouchSPKSTH19,
  author       = {Hussam Amrouch and
                  Victor M. van Santen and
                  Om Prakash and
                  Hammam Kattan and
                  Sami Salamin and
                  Simon Thomann and
                  J{\"{o}}rg Henkel},
  editor       = {Dimitris Gizopoulos and
                  Dan Alexandrescu and
                  Panagiota Papavramidou and
                  Michail Maniatakos},
  title        = {Reliability Challenges with Self-Heating and Aging in FinFET Technology},
  booktitle    = {25th {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2019, Rhodes, Greece, July 1-3, 2019},
  pages        = {68--71},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IOLTS.2019.8854405},
  doi          = {10.1109/IOLTS.2019.8854405},
  timestamp    = {Sat, 09 Apr 2022 12:38:44 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/AmrouchSPKSTH19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}