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"Reliability Challenges with Self-Heating and Aging in FinFET Technology."
Hussam Amrouch et al. (2019)
- Hussam Amrouch
, Victor M. van Santen
, Om Prakash, Hammam Kattan, Sami Salamin, Simon Thomann
, Jörg Henkel:
Reliability Challenges with Self-Heating and Aging in FinFET Technology. IOLTS 2019: 68-71
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