"Reliability Challenges with Self-Heating and Aging in FinFET Technology."

Hussam Amrouch et al. (2019)

Details and statistics

DOI: 10.1109/IOLTS.2019.8854405

access: closed

type: Conference or Workshop Paper

metadata version: 2022-04-09

a service of  Schloss Dagstuhl - Leibniz Center for Informatics