BibTeX record conf/imw2/RachidiAVDBKObR22

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@inproceedings{DBLP:conf/imw2/RachidiAVDBKObR22,
  author       = {S. Rachidi and
                  Antonio Arreghini and
                  Devin Verreck and
                  G. L. Donadio and
                  K. Banerjee and
                  K. Katcko and
                  Yusuke Oniki and
                  Geert Van den Bosch and
                  Maarten Rosmeulen},
  title        = {At the Extreme of 3D-NAND Scaling: 25 nm Z-Pitch with 10 nm Word Line
                  Cells},
  booktitle    = {{IEEE} International Memory Workshop, {IMW} 2022, Dresden, Germany,
                  May 15-18, 2022},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IMW52921.2022.9779303},
  doi          = {10.1109/IMW52921.2022.9779303},
  timestamp    = {Wed, 07 Aug 2024 10:14:45 +0200},
  biburl       = {https://dblp.org/rec/conf/imw2/RachidiAVDBKObR22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}