BibTeX record conf/idt/HamiehMOCK11

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@inproceedings{DBLP:conf/idt/HamiehMOCK11,
  author       = {Layla Hamieh and
                  Nader Mehdi and
                  Ghazalah Omeirat and
                  Ali Chehab and
                  Ayman I. Kayssi},
  title        = {The effectiveness of delay and {IDDT} tests in detecting resistive
                  open defects for nanometer {CMOS} adder circuits},
  booktitle    = {6th {IEEE} International Design and Test Workshop, {IDT} 2011, Beirut,
                  Lebanon, 11-14 December 2011},
  pages        = {53--57},
  publisher    = {{IEEE}},
  year         = {2011},
  url          = {https://doi.org/10.1109/IDT.2011.6123101},
  doi          = {10.1109/IDT.2011.6123101},
  timestamp    = {Tue, 21 Mar 2023 21:02:48 +0100},
  biburl       = {https://dblp.org/rec/conf/idt/HamiehMOCK11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}