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BibTeX record conf/idt/HamiehMOCK11
@inproceedings{DBLP:conf/idt/HamiehMOCK11, author = {Layla Hamieh and Nader Mehdi and Ghazalah Omeirat and Ali Chehab and Ayman I. Kayssi}, title = {The effectiveness of delay and {IDDT} tests in detecting resistive open defects for nanometer {CMOS} adder circuits}, booktitle = {6th {IEEE} International Design and Test Workshop, {IDT} 2011, Beirut, Lebanon, 11-14 December 2011}, pages = {53--57}, publisher = {{IEEE}}, year = {2011}, url = {https://doi.org/10.1109/IDT.2011.6123101}, doi = {10.1109/IDT.2011.6123101}, timestamp = {Tue, 21 Mar 2023 21:02:48 +0100}, biburl = {https://dblp.org/rec/conf/idt/HamiehMOCK11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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