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"The effectiveness of delay and IDDT tests in detecting resistive open ..."
Layla Hamieh et al. (2011)
- Layla Hamieh, Nader Mehdi, Ghazalah Omeirat, Ali Chehab, Ayman I. Kayssi:
The effectiveness of delay and IDDT tests in detecting resistive open defects for nanometer CMOS adder circuits. IDT 2011: 53-57
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