BibTeX record conf/idsta/ChaOKJ20

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@inproceedings{DBLP:conf/idsta/ChaOKJ20,
  author       = {Jaegyeong Cha and
                  Seokju Oh and
                  Donghyun Kim and
                  Jongpil Jeong},
  title        = {A Defect Detection Model for Imbalanced Wafer Image Data Using {CAE}
                  and Xception},
  booktitle    = {International Conference on Intelligent Data Science Technologies
                  and Applications, {IDSTA} 2020, Valencia, Spain (Online Event), October
                  19-22, 2020},
  pages        = {28--33},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IDSTA50958.2020.9264135},
  doi          = {10.1109/IDSTA50958.2020.9264135},
  timestamp    = {Mon, 15 Nov 2021 13:04:27 +0100},
  biburl       = {https://dblp.org/rec/conf/idsta/ChaOKJ20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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