BibTeX record conf/icst/HirutaSN22

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@inproceedings{DBLP:conf/icst/HirutaSN22,
  author       = {Yasuaki Hiruta and
                  Hidetoshi Suhara and
                  Yasuharu Nishi},
  title        = {Patterns to Improve Fidelity for Model-Based Testing},
  booktitle    = {15th {IEEE} International Conference on Software Testing, Verification
                  and Validation Workshops {ICST} Workshops 2022, Valencia, Spain, April
                  4-13, 2022},
  pages        = {240--243},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ICSTW55395.2022.00049},
  doi          = {10.1109/ICSTW55395.2022.00049},
  timestamp    = {Mon, 13 Jun 2022 16:53:37 +0200},
  biburl       = {https://dblp.org/rec/conf/icst/HirutaSN22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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