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"Patterns to Improve Fidelity for Model-Based Testing."

Yasuaki Hiruta, Hidetoshi Suhara, Yasuharu Nishi (2022)

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DOI: 10.1109/ICSTW55395.2022.00049

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-13

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  dblp key:
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Yasuaki Hiruta, Hidetoshi Suhara, Yasuharu Nishi:
Patterns to Improve Fidelity for Model-Based Testing. ICST Workshops 2022: 240-243

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