BibTeX record conf/icecsys/FawazJKCK11

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@inproceedings{DBLP:conf/icecsys/FawazJKCK11,
  author       = {Ahmed Fawaz and
                  Ameen Jaber and
                  Ali Kassem and
                  Ali Chehab and
                  Ayman I. Kayssi},
  title        = {Assessing testing techniques for resistive-open defects in nanometer
                  {CMOS} adders},
  booktitle    = {18th {IEEE} International Conference on Electronics, Circuits and
                  Systems, {ICECS} 2011, Beirut, Lebanon, December 11-14, 2011},
  pages        = {165--168},
  publisher    = {{IEEE}},
  year         = {2011},
  url          = {https://doi.org/10.1109/ICECS.2011.6122240},
  doi          = {10.1109/ICECS.2011.6122240},
  timestamp    = {Tue, 21 Mar 2023 20:55:52 +0100},
  biburl       = {https://dblp.org/rec/conf/icecsys/FawazJKCK11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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