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"Assessing testing techniques for resistive-open defects in nanometer CMOS ..."
Ahmed Fawaz et al. (2011)
- Ahmed Fawaz, Ameen Jaber, Ali Kassem, Ali Chehab, Ayman I. Kayssi:
Assessing testing techniques for resistive-open defects in nanometer CMOS adders. ICECS 2011: 165-168
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