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BibTeX record conf/iccd/WenMSYKWS06
@inproceedings{DBLP:conf/iccd/WenMSYKWS06, author = {Xiaoqing Wen and Kohei Miyase and Tatsuya Suzuki and Yuta Yamato and Seiji Kajihara and Laung{-}Terng Wang and Kewal K. Saluja}, title = {Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation}, booktitle = {24th International Conference on Computer Design {(ICCD} 2006), 1-4 October 2006, San Jose, CA, {USA}}, pages = {251--258}, publisher = {{IEEE}}, year = {2006}, url = {https://doi.org/10.1109/ICCD.2006.4380825}, doi = {10.1109/ICCD.2006.4380825}, timestamp = {Thu, 23 Mar 2023 23:59:54 +0100}, biburl = {https://dblp.org/rec/conf/iccd/WenMSYKWS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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