BibTeX record conf/iccais/PhamNHNLLL23

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@inproceedings{DBLP:conf/iccais/PhamNHNLLL23,
  author       = {Quang Vuong Pham and
                  Manh Duy Ngo and
                  Sy Phuong Hoang and
                  Phuong Huy Nguyen and
                  Duc Minh Le and
                  Van Su Luong and
                  Minhhuy Le},
  title        = {Deep Learning-based Thickness Measurement With Pulse Eddy Current
                  Testing},
  booktitle    = {12th International Conference on Control, Automation and Information
                  Sciences, {ICCAIS} 2023, Hanoi, Vietnam, November 27-29, 2023},
  pages        = {28--33},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ICCAIS59597.2023.10382337},
  doi          = {10.1109/ICCAIS59597.2023.10382337},
  timestamp    = {Thu, 21 Mar 2024 22:28:46 +0100},
  biburl       = {https://dblp.org/rec/conf/iccais/PhamNHNLLL23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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