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"Deep Learning-based Thickness Measurement With Pulse Eddy Current Testing."
Quang Vuong Pham et al. (2023)
- Quang Vuong Pham, Manh Duy Ngo, Sy Phuong Hoang, Phuong Huy Nguyen, Duc Minh Le, Van Su Luong, Minhhuy Le:
Deep Learning-based Thickness Measurement With Pulse Eddy Current Testing. ICCAIS 2023: 28-33
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