BibTeX record conf/iccad/BoppanaF98

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@inproceedings{DBLP:conf/iccad/BoppanaF98,
  author       = {Vamsi Boppana and
                  W. Kent Fuchs},
  editor       = {Hiroto Yasuura},
  title        = {Dynamic fault collapsing and diagnostic test pattern generation for
                  sequential circuits},
  booktitle    = {Proceedings of the 1998 {IEEE/ACM} International Conference on Computer-Aided
                  Design, {ICCAD} 1998, San Jose, CA, USA, November 8-12, 1998},
  pages        = {147--154},
  publisher    = {{ACM} / {IEEE} Computer Society},
  year         = {1998},
  url          = {https://doi.org/10.1145/288548.288593},
  doi          = {10.1145/288548.288593},
  timestamp    = {Fri, 24 Mar 2023 00:01:52 +0100},
  biburl       = {https://dblp.org/rec/conf/iccad/BoppanaF98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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